IGI Expands AOI Capabilities for Zero Defect Masks
Apr 24, 2006
Author: Kendra Stritch

Minneapolis MN, April 24th 2006 – IGI, the leading supplier of large-area precision imaging, announced the acquisition of its 3rd automated large area mask (LAM) defect inspection tool. This new tool offers DRC, Die to Die, and CAD reference inspections. IGI’s automated LAM defect inspection capabilities are submicron defect identification on a mask up to 14” x 14” and 4 um defect identification on a mask up to 22” x 28”. This inspection capability coupled with IGI’s LAM repair capabilities for clear and dark fields, lets IGI deliver defect free masks.

This addition demonstrates IGI’s continued commitment to zero defect masks. IGI was the first LAM manufacturer with automated LAM defect inspection capabilities when it unveiled its first system in 2002. Since the installation of the first automated LAM defect inspection tool IGI has continually increased its imaging, repair, and inspection capabilities.

IGI is a precision imaging company with over 35 years of experience. IGI offers an array of products and services including photomasks, photoplotting, calibration grids, encoders, custom imaging, vacuum deposition, and phototooling design and checking software. IGI supplies several different markets including the packaging, chemical milling, MEMS, nanotechnology, and printed wiring board industries. IGI is the preferred supplier of precise digital imaging services and products to our customers at a level of excellence that encourages them to recommend us to others. We accomplish this by meeting or exceeding our customers' needs with the fastest, most cost effective products and services.